Abstract—Testing of integrated circuits (IC’s) is of crucial importance to ensure a high level of quality in product functionality in both commercially and privately produced products. Due to complex systems, its very difficult to test it. One solution to this problem is to add logic to the IC so that it can test itself. This is referred to as “Built in self Test” (BIST). In this work, we are designing BIST controller which will detect and correct errors while computing greatest common divisor (gcd) of two non-negative integers using two approaches i.e Euclid’s algorithm and Stein’s algorithm and comparing the results of both approaches , that we are using in this work. The most efficient way that will come can use for the applications for finding gcd.
Index Terms—Build-in-self-test(BIST), Euclid’s algorithm, Stein’s algorithm, VLSI testing.
Sachin D. Kohale is a Post-Graduate Student with the Dept. of Computer Science and Engineering, G.H.Raisoni College of Engineering, Hingna Road, Nagpur, Maharashtra, India (e-mail: email@example.com).
Ratnaprabha. W. Jasutkar is a Assistant Professor with the Dept. of Computer Science and Engineering, G.H.Raisoni College of Engineering, Hingna Road, Nagpur, Maharashtra, India (e-mail: firstname.lastname@example.org).
Cite:Sachin D. Kohale and Ratnaprabha. W. Jasutkar, "Fpga Based Implementation of Bist Controller Using Different Approaches," International Journal of Materials, Mechanics and Manufacturing vol. 1, no. 2, pp. 110-113, 2013.