• Sep 20, 2019 News!IJMMM Had Implemented Online Submission System, Please Submit New Submissions through This System Only!   [Click]
  • Feb 26, 2018 News!'Writing Tips' shared by Prof. Ian McAndrew!   [Click]
  • Dec 18, 2019 News!IJMMM Vol.7, No.6 has been published with online version.   [Click]
General Information
    • ISSN: 1793-8198 (Print)
    • Abbreviated Title: Int. J. Mater. Mech. Manuf.
    • Frequency: Bimonthly
    • DOI: 10.18178/IJMMM
    • Editor-in-Chief: Prof. Ian McAndrew
    • Co-editor-in-Chief: Prof. K. M. Gupta
    • Executive Editor: Cherry L. Chen
    • Abstracting/Indexing: EI (INSPEC, IET), Chemical Abstracts Services (CAS),  ProQuest, Crossref, Ulrich's Periodicals Directory,  EBSCO.
    • E-mail ijmmm@ejournal.net

Prof. Ian McAndrew
Capitol Technology University, USA
It is my honor to be the editor-in-chief of IJMMM. I will do my best to work with the editorial team and help make this journal better.

IJMMM 2018 Vol.6(3): 170-177 ISSN: 1793-8198
DOI: 10.18178/ijmmm.2018.6.3.370

Multimodal Artifact Metrics for Conductive Synthetic Resin Products

Masaki Fujikawa, Kouki Jitsukawa and Shingo Fuchi
Abstract—In this paper, we propose multimodal artifact metrics, which are based on multimodal identification metrics in biometrics. These metrics should verify an artifact’s authenticity with high accuracy using more than two characteristic types of information with different physical characteristics that are extracted from the artifact. In this technique, the counterfeiting of copied products is more difficult, even for the manufacturers who are producing the genuine products. In order to explore the feasibility of this idea, we present the results of two experiments: One is the creation of samples made of conductive polymer and filler with optical characteristics. The other one extracts two types of characteristic information from each sample. The extracted information (resistance and IR image) was different for each specimen, as we anticipated.

Index Terms—Artifact metrics, characteristic information, multimodal, verification of authenticity.

Masaki Fujikawa and Kouki Jitsukawa are with the Faculty of Informatics, Kogakuin University, Nishi-Shinjuku 1-24-2, Shinjuku, 163-8677 Tokyo Japan. (email: fujikawa@cc.kogakuin.ac.jp).
Shingo Fuchi is with the Department of Electrical Engineering and Electronics, Aoyama Gakuin University, 5-10-1 Fuchinobe, Chuo-ku, Sagamihara-shi, Kanagawa 252-5258 Japan.


Cite: Masaki Fujikawa, Kouki Jitsukawa and Shingo Fuchi, "Multimodal Artifact Metrics for Conductive Synthetic Resin Products," International Journal of Materials, Mechanics and Manufacturing vol. 6, no. 3, pp. 170-177, 2018.

Copyright © 2008-2020. International Journal of Materials, Mechanics and Manufacturing. All rights reserved.
E-mail: ijmmm@ejournal.net