Abstract—X-ray photoelectron spectroscopy a technique was used in order to characterize, ionic state of Fe and chemical composition of Fe doped TiO2. XPS detected Iron in form of Fe2+ and Fe3+. Surface atomic concentrations were measured. Light exposed and reference samples were compared. Light irradiation affected charge transfer on the surface of Iron doped TiO2. After light exposing XPS measurements showed that Ti4+ peak intensity decreased and shifted positively, O1s spectrum showed presence of increased amount of OH radicals, valence band spectra intensity increased.
Index Terms—XPS, TiO2, Fe3+, Fe2+, Fe doped TiO2.
Sungjin Kim is the corresponding author.
Amir Abidov, Bunyod Allabergenov, Jeonghwan Lee, Soon-Wook Jeong , Sungjin Kim are with the Department of Advanced Materials Engineering, Kumoh National Institute of Technology, Deahak-Ro 61, Gumi, Gyeongbuk 730-701, Korea (e-mail: abidov_kit@yahoo.com, bunyod_kit@yahoo.com, bibicon1@nate.com, swjeong@kumoh.ac.kr, sjghim0602@nate.com).
Heung-Woo Jeon is with the Department of Electronic Engineering, Kumoh National Institute of Technology, Deahak-Ro 61, Gumi, Gyeongbuk 730-701, Korea (e-mail: hwjeon@kumoh.ac.kr).
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Cite:Amir Abidov, Bunyod Allabergenov, Jeonghwan Lee, Heung-Woo Jeon, Soon-Wook Jeong, and Sungjin Kim, "X-Ray Photoelectron Spectroscopy Characterization of Fe Doped TiO2 Photocatalyst," International Journal of Materials, Mechanics and Manufacturing vol. 1, no. 3, pp. 294-296, 2013.
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