Abstract—Raman spectra of PrMnO3 thin films deposited on
lattice mismatched substrate (LaAlO3) show a pronounced
dependence on the film thickness and also on the degree of
lattice mismatch. PrMnO3 thin films were deposited by pulsed
laser deposition on LaAlO3 substrate, on this substrate the films
experience in-plane compressive and therefore out-of-plane
tensile strain. The gradual release of strain on increasing the
film thickness is observed by the values of out-of-plane lattice
parameters calculated by (002) reflection of films. A systematic
trend in the Raman modes on increasing the thickness was also
observed in the Raman spectra. All the Raman modes showed
hardening on decreasing the thickness. This is attributed to the
effect of strain gradually decreases on increasing the thickness
of the films. Raman modes also seem to be sensitive to the lattice
distortion in the thinner films.
Index Terms—Jahn-teller distortion, manganite thin films,
pulsed laser deposition, raman spectroscopy.
Aditi Chaturvedi is with Department of Physics, Indian Institute of
Technology Bombay, Powai-400076, Mumbai (e-mail:
aditimailu@gmail.com).
V. G. Sathe is with UGC-DAE Consortium for Scientific Research,
University Campus,Khandwa Road, Indore, India (e-mail:
vasant@csr.res.in).
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Cite:Aditi Chaturvedi and V. G. Sathe, "Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films," International Journal of Materials, Mechanics and Manufacturing vol. 2, no. 1, pp. 29-31, 2014.
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