• Mar 24, 2016 News!Vol.3, No.3 has been indexed by EI(Inspec)!   [Click]
  • Sep 27, 2017 News!IJMMM Vol.6, No.3 has been published with online version. 16 peer reviewed articles are published in this issue.   [Click]
  • Sep 25, 2017 News!IJMMM Vol.6, No.2 has been published with online version. 16 peer reviewed articles are published in this issue.   [Click]
General Information
    • ISSN: 1793-8198
    • Frequency: Quarterly
    • DOI: 10.18178/IJMMM
    • Editor-in-Chief: Prof. K. M. Gupta, Prof. Ian McAndrew
    • Executive Editor: Ms. Cherry L. Chen
    • Abstracting/Indexing: EI (INSPEC, IET), Chemical Abstracts Services (CAS), Engineering & Technology Digital Library,  ProQuest, Crossref, Ulrich's Periodicals Directory, DOAJ, and Electronic Journals Library .
    • E-mail ijmmm@ejournal.net
Editor-in-chief
Prof. Ian McAndrew
Embry Riddle Aeronautical University, UK.
It is my honor to be the editor-in-chief of IJMMM. I will do my best to help develop this journal better.

IJMMM 2014 Vol.2(1): 29-31 ISSN: 1793-8198
DOI: 10.7763/IJMMM.2014.V2.93

Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films

Aditi Chaturvedi and V. G. Sathe
Abstract—Raman spectra of PrMnO3 thin films deposited on lattice mismatched substrate (LaAlO3) show a pronounced dependence on the film thickness and also on the degree of lattice mismatch. PrMnO3 thin films were deposited by pulsed laser deposition on LaAlO3 substrate, on this substrate the films experience in-plane compressive and therefore out-of-plane tensile strain. The gradual release of strain on increasing the film thickness is observed by the values of out-of-plane lattice parameters calculated by (002) reflection of films. A systematic trend in the Raman modes on increasing the thickness was also observed in the Raman spectra. All the Raman modes showed hardening on decreasing the thickness. This is attributed to the effect of strain gradually decreases on increasing the thickness of the films. Raman modes also seem to be sensitive to the lattice distortion in the thinner films.

Index Terms—Jahn-teller distortion, manganite thin films, pulsed laser deposition, raman spectroscopy.

Aditi Chaturvedi is with Department of Physics, Indian Institute of Technology Bombay, Powai-400076, Mumbai (e-mail: aditimailu@gmail.com). V. G. Sathe is with UGC-DAE Consortium for Scientific Research, University Campus,Khandwa Road, Indore, India (e-mail: vasant@csr.res.in).

[PDF]

Cite:Aditi Chaturvedi and V. G. Sathe, "Thickness Dependent X-Ray and Raman Studies of PrMnO3 Thin Films," International Journal of Materials, Mechanics and Manufacturing vol. 2, no. 1, pp. 29-31, 2014.

Copyright © 2008-2015. International Journal of Materials, Mechanics and Manufacturing. All rights reserved.
E-mail: ijmmm@ejournal.net