• Sep 20, 2019 News!IJMMM Had Implemented Online Submission System, Please Submit New Submissions through This System Only!   [Click]
  • Feb 26, 2018 News!'Writing Tips' shared by Prof. Ian McAndrew!   [Click]
  • Mar 23, 2021 News!Vol. 7, No. 2 has been indexed byInspec (IET)!   [Click]
General Information
    • ISSN: 1793-8198 (Print)
    • Abbreviated Title: Int. J. Mater. Mech. Manuf.
    • Frequency: Bimonthly
    • DOI: 10.18178/IJMMM
    • Editor-in-Chief: Prof. Ian McAndrew
    • Co-editor-in-Chief: Prof. K. M. Gupta
    • Executive Editor: Cherry L. Chen
    • Abstracting/Indexing: Inspec (IET), Chemical Abstracts Services (CAS),  ProQuest, Crossref, Ulrich's Periodicals Directory,  EBSCO.
    • E-mail ijmmm@ejournal.net

Prof. Ian McAndrew
Capitol Technology University, USA
It is my honor to be the editor-in-chief of IJMMM. I will do my best to work with the editorial team and help make this journal better.

IJMMM 2014 Vol.2(3): 197-201 ISSN: 1793-8198
DOI: 10.7763/IJMMM.2014.V2.127

Production Rate Based Dynamic Dispatching Rule Selection in a Wafer FAB

Yong H. Chung, Won K. Ham, and Sang C. Park
Abstract—This paper proposes a state-dependent dispatching rule to achieve on-time delivery as well as minimum of mean cycle time in a wafer FAB. Dispatching rule should be selected dynamically according to current system state and operation objective, since condition in a wafer fab is dynamically changed. In this paper, we use ‘pegging’ to identify a current state of a wafer FAB. Pegging is defined as the process of assigning wafer lots to orders, and it is very essential to meet customers’ demands in terms of quality, quantity, and due dates in a wafer FAB. As a result, pegging decides target move for each step, it is necessary to select WIP lot to be processed next. The proposed state-dependent dispatching rule consists of two stages. At the first stage, WIP lots are classified into two groups which has priority, and classical dispatching rule is applied to select a WIP lot at the second stage. The target move and actual move are computed by the combination of pegging and simulation. We developed a simulation model by using MIMAC6, and conducted simulation with SEEPLAN®.

Index Terms—State-dependent dispatching rule, simulation, wafer FAB, pegging.

The authors are with the Department of Industrial Engineering, Ajou University, Suwon, Republic of Korea (e-mail: yongho1230@gmail.com, {lunacy, scpark}@ajou.ac.kr).


Cite: Yong H. Chung, Won K. Ham, and Sang C. Park, "Production Rate Based Dynamic Dispatching Rule Selection in a Wafer FAB," International Journal of Materials, Mechanics and Manufacturing vol. 2, no. 3, pp. 197-201, 2014.

Copyright © 2008-2020. International Journal of Materials, Mechanics and Manufacturing. All rights reserved.
E-mail: ijmmm@ejournal.net